The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Apr. 13, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Inventors:
Young Kim, Yongin-si, KR;
Yongchul Kim, Seoul, KR;
Jaechul Park, Yangju-si, KR;
Kangho Lee, Osan-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); H04N 5/32 (2006.01); H04N 5/359 (2011.01); G01T 1/16 (2006.01); H04N 5/378 (2011.01); G01T 1/17 (2006.01);
U.S. Cl.
CPC ...
H04N 5/32 (2013.01); G01T 1/16 (2013.01); G01T 1/17 (2013.01); H04N 5/359 (2013.01); H04N 5/378 (2013.01);
Abstract
Provided are methods of detecting X-rays, a photographing methods using the X-ray detecting method and/or an X-ray detector using the methods. For example, one method of detecting X-rays includes radiating a first X-ray, removing, by a first X-ray detection unit, a first electric charge generated by the radiated first X-ray, and outputting, by a second X-ray detection unit adjacent to the first X-ray detection unit, a voltage corresponding to the first X-ray.