The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Oct. 14, 2015
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Gregory D. VanWiggeren, San Jose, CA (US);

Keith F. Anderson, Santa Rosa, CA (US);

Nilesh R. Gheewala, Santa Rosa, CA (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/15 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/0085 (2013.01); H04B 17/21 (2015.01);
Abstract

Network analysis employs a band-limited multi-tone test signal having a tunable center frequency to test a device under test (DUT). A hybrid network analyzer includes a test signal source to provide the band-limited multi-tone test signal, and a local oscillator (LO) source to provide a tunable LO signal configured to track the tunable center frequency of the band-limited multi-tone test signal. The hybrid network analyzer further includes a receiver to convert into an intermediate frequency (IF) signal using the tunable LO signal one or both of the band-limited multi-tone test signal and a response signal from a device under test (DUT) produced in response to the band-limited multi-tone test signal. The test signal source is further configured to provide a tunable single-tone test signal and a broadband multi-tone test signal to test the DUT in various modes.


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