The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Sep. 29, 2014
Applicant:

Vayyar Imaging Ltd, Yehud, IL;

Inventor:

Shay Moshe, Petach Tikva, IL;

Assignee:

VAYYAR IMAGING LTD., Yehud, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H04B 17/12 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 17/12 (2015.01); H04B 17/21 (2015.01);
Abstract

A method and a system for calibrating an antenna array. The method may include the following steps: attaching successively pairs of a plurality of probe antennas to each other; performing an initial measurement of a multiport formed by the ports of said pair of probe antennas, the initial measurement yielding initial coefficients of said probe antennas; attaching successively one of said probe antennas to one of the antennas in said antenna array; performing a second measurement of multiports formed by the ports of said probe antennas and said antenna array, the second measurement yielding coefficients of the combination of said antenna array and said probe antennas; and using the initial coefficients and the second measurement coefficients to calibrate said antenna array.


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