The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Jul. 22, 2014
Applicant:

Fairchild Semiconductor Corporation, San Jose, CA (US);

Inventor:

Ahmad R. Ashrafzadeh, Morgan Hill, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01H 35/14 (2006.01); H01H 37/00 (2006.01); H01H 47/24 (2006.01); H01H 47/26 (2006.01); H03K 17/082 (2006.01); H03K 17/12 (2006.01); H03K 17/08 (2006.01);
U.S. Cl.
CPC ...
H03K 17/0828 (2013.01); H03K 17/127 (2013.01); H01L 2224/48145 (2013.01); H01L 2224/48247 (2013.01); H01L 2224/48257 (2013.01); H01L 2224/49111 (2013.01); H01L 2924/13055 (2013.01); H03K 2017/0806 (2013.01); Y10T 307/773 (2015.04);
Abstract

In a general aspect, an apparatus can include a temperature measurement circuit configured to produce a first signal indicating a first operating temperature of a first semiconductor device and a temperature comparison circuit operationally coupled with the temperature measurement circuit. The temperature comparison circuit can be configured to compare the first signal with a second signal indicating a second operating temperature of at least a second semiconductor device and produce a comparison signal indicating whether the indicated first operating temperature is higher, lower or equal to the indicated second operating temperature. The apparatus can also include an adjustment circuit configured to adjust operation of the first semiconductor device based on the comparison signal.


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