The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Jun. 26, 2014
Applicant:

Hexagon Metrology, Inc., North Kingstown, RI (US);

Inventors:

Sandeep Pulla, La Jolla, CA (US);

Homer Eaton, Carlsbad, CA (US);

Assignee:

Hexagon Metrology, Inc., North Kingstown, RI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 15/00 (2011.01); G01C 3/14 (2006.01); G01B 11/26 (2006.01); G01B 5/004 (2006.01); G06T 11/60 (2006.01); G01B 21/04 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); G01B 21/04 (2013.01); G06T 7/73 (2017.01); G06T 2207/20221 (2013.01);
Abstract

Systems and methods for transprojection of geometry data acquired by a coordinate measuring machine (CMM). The CMM acquires geometry data corresponding to 3D coordinate measurements collected by a measuring probe that are transformed into scaled 2D data that is transprojected upon various digital object image views captured by a camera. The transprojection process can utilize stored image and coordinate information or perform live transprojection viewing capabilities in both still image and video modes.


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