The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Jun. 17, 2016
Amazon Technologies, Inc., Seattle, WA (US);
Oleg Kantor, Kirkland, WA (US);
Tak Keung Joseph Lui, Bellevue, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Techniques for determining an item location based on multiple RFID parameters from multiple read events are described. In an example, a computer system may access a first read event. A first RFID reader located within a first zone may have generated the first read event at a first time. The first read event may identify an RFID tag and may include first RFID parameters. The computer system may access a second read event. A second RFID reader located within a second zone may have generated the second read event at a second time within a predefined amount of time from the first time. The second read event may identify the RFID tag and include second RFID parameters. The computer system may determine whether the item location falls within the first zone or the second zone based on two or more first RFID parameters and two or more second RFID parameters.