The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Mar. 22, 2016
Applicant:
Interana, Inc., Redwood City, CA (US);
Inventors:
Robert Johnson, Redwood City, CA (US);
Lior Abraham, Redwood City, CA (US);
Ann Johnson, Redwood City, CA (US);
Boris Dimitrov, Redwood City, CA (US);
Don Fossgreen, Redwood City, CA (US);
Assignee:
Interana, Inc., Redwood City, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01); G06F 17/30395 (2013.01); G06F 17/30486 (2013.01); G06F 17/30536 (2013.01); G06F 17/30584 (2013.01);
Abstract
A method for rapid data analysis comprising receiving and interpreting a query, collecting a first data sample from the first set of data shards, calculating an intermediate result to the query based on analysis of the first data sample, identifying a second set of data shards based on the intermediate result, collecting a second data sample from the second set of data shards, and calculating a final result to the query based on analysis of the second data sample.