The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Sep. 30, 2014
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Stephen G. Graham, Chapel Hill, NC (US);

Shashwat Srivastav, Seattle, WA (US);

Sriram Sankaran, Redmond, WA (US);

Vishrut Shah, Redmond, WA (US);

Qi Zhang, Redmond, WA (US);

Jun Luo, Bellevue, WA (US);

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30336 (2013.01); G06F 17/30463 (2013.01);
Abstract

An object storage system having object metadata query capability. Clients can pose queries to the object system in a high-level, declarative language. A query is evaluated against stored object metadata, and only objects satisfying the query's predicates are returned. The object storage system can evaluate alternative logical and physical query plans using a cost model. Queries can be posed using familiar REST-based APIs. The object storage system includes a distributed key-value store for secondary indexing of object metadata. A user can define secondary indexes considering the most common object access patterns.


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