The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Apr. 10, 2013
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Sreerupa Das, Oviedo, FL (US);

Amar Patel, Orlando, FL (US);

Steven McNamara, Davenport, FL (US);

Jonathan Todd, Cocoa, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01M 99/00 (2011.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/00 (2013.01); G01M 99/005 (2013.01); G05B 23/024 (2013.01); G05B 23/0254 (2013.01);
Abstract

Mechanisms for generating an analysis result about a machine are provided. A device generates a first health management (HM) analysis result regarding a machine based on real-time first sensor information received during a first period of time and on a first version HM analytic model. The device provides, to an off-board device, a plurality of sensor information comprising the real-time first sensor information and that is generated during the first period of time. The device receives a second version HM analytic model that is based at least in part on the plurality of sensor information and fault information that identifies actual faults that have occurred on the machine. The device generates a second HM analysis result regarding the machine based on real-time second sensor information received during a second period of time and on the second version HM analytic model.


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