The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Jul. 13, 2012
Tetsuo Otani, Komae, JP;
Yuji Kimura, Tokyo, JP;
Shigeki Katayama, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
Disclosed is a dynamic facility management system that is able to start quickly and monitor a state when various measuring instruments are attached to or removed from the facility to be securely monitored and maintained. The system includes a sensor as a measuring instrument. A measuring instrument reading device, which is a lower level device, transmits a type of the measuring instrument and a purpose of connecting the measuring instrument to a directory server. The directory server generates an instance by referring to class information and generates and registers a relation instance by referring to an inter-class relationship. The directory server transmits the generated instance to related devices on the basis of an inter-instance relationship, and the directory server exchanges facility management data between instances on the basis of the inter-instance relationship.