The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Jul. 21, 2014
Honeywell International Inc., Morristown, NJ (US);
Joseph Z. Lu, Glendale, AZ (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method includes obtaining a planning model for an industrial facility at a master MPC controller and sending at least one optimization call from the master MPC controller to one or more slave MPC controllers. The method also includes receiving at least one proxy limit value from the slave MPC controller(s) in response to the at least one optimization call. The at least one proxy limit value identifies to what extent one or more process variables controlled by the slave MPC controller(s) are adjustable without violating any process variable constraints. In addition, the method includes performing plantwide optimization at the master MPC controller using the planning model and the at least one proxy limit value. The at least one proxy limit value allows the master MPC controller to honor the process variable constraints of the slave MPC controller(s) during the plantwide optimization.