The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Aug. 13, 2014
Honeywell International Inc., Morristown, NJ (US);
Gobinath Pandurangan, Karnataka, IN;
Kishen Manjunath, Karnataka, IN;
Sanjay Kantilal Dave, Karnataka, IN;
Honeywell International Inc., Morristown, NJ (US);
Abstract
A system and method for performing management and diagnostic functions in a cloud computing system for advanced process control (APC). A cloud based APC management computer retrieves operating process data from an APC control computer and performs an iterative step test on the APC system. The iterative step test modifies at least one test parameter of the operating process data and identifies changes to a set of remaining parameters of the operating process data resulting from modification of the test parameter. The APC management computer determines at least one process variable from the iterative step test and generates at least one process model based on the process variable. The APC management computer transmits the process model to the APC control computer.