The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Jul. 02, 2014
Applicants:

William A. Burnett, Houston, TX (US);

Andrew P. Shatilo, Houston, TX (US);

Thomas A. Dickens, Houston, TX (US);

Inventors:

William A. Burnett, Houston, TX (US);

Andrew P. Shatilo, Houston, TX (US);

Thomas A. Dickens, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/30 (2013.01); G01V 2210/51 (2013.01);
Abstract

In the present inventive method, individual traces of seismic data are migrated () without any assembling of different midpoints or any summing of different offsets, so that post-migration processing or analysis, e.g. trace alignment, may be applied to the individual migrated traces () to compensate for any deficiencies among them, before stack and assembly. Thus, the present invention fully separates the steps of migration (), assembly (), and stacking (), which are combined together in traditional migration. Thus, imaging deficiencies can be measured and addressed in the image space before they are obscured by summation. Afterward, summation can proceed to construct the improved final image ().


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