The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Jun. 12, 2015
Applicants:

Mitsubishi Heavy Industries Mechatronics Systems, Ltd., Hyogo, JP;

Osaka University, Osaka, JP;

Inventors:

Shuhei Kuri, Kobe, JP;

Toshiharu Takahashi, Kobe, JP;

Hiroshi Horiike, Suita, JP;

Eiji Hoashi, Suita, JP;

Isao Murata, Suita, JP;

Sachiko Doi, Suita, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 3/00 (2006.01);
U.S. Cl.
CPC ...
G01T 3/00 (2013.01);
Abstract

Provided are a neutron monitor device and a neutron measurement method which make it easier to measure the intensity of the neutrons having the energy region of 10 KeV to several hundreds KeV. A neutron monitor device includes a first detector which includes a hemispherical first body formed of PE and having a radius of 31 mm, a first specimen containing GaN disposed at the center of the first body, a Cd layer provided on an outer surface of the first body, and a B layer provided inside the first body, and a second detector which includes a hemispherical second body formed of PE and having a radius of 27 mm, a second specimen containing GaN disposed at the center of the second body, a B layer provided on the outer surface of the second body, and a Cd layer provided inside the second body.


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