The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Oct. 20, 2016
International Business Machines Corporation, Armonk, NY (US);
Gerard M. Salem, Essex Junction, VT (US);
Andrew A. Turner, Underhill, VT (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method, system, and/or computer program product of scanning of an integrated circuit including chiplets to isolate fault locations is provided herein. The scanning of the integrated circuit includes providing, by a pervasive of the integrated circuit, an input to the chiplets. Each of the chiplets can include a pervasive satellite, a multiplexer, and latches. The scanning of the integrated circuit includes also scanning, by each pervasive satellite of the chiplets, data based on the input via the multiplexer into the latches to produce scan data for each of the chiplets. The scanning of the integrated circuit also includes comparing, by the pervasive of the integrated circuit, the scan data of each of the chiplets to expectant data stored on the pervasive to isolate the fault locations.