The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Aug. 31, 2012
Marcus Kandler, Flörsbachtal, DE;
Jan Michael Salziger, Esslingen, DE;
Marcus Kandler, Flörsbachtal, DE;
Jan Michael Salziger, Esslingen, DE;
TAKATA AG, Aschaffenburg, DE;
Abstract
A method and a device for testing an electronic appliance for determining at least one variable of a system. The electronic appliance is designed in the form of a sensor. The method includes defining an expected minimum and/or maximum value of the variable and producing an electric signal by means of the electronic appliance depending on the variable. The method also includes detecting at least one value of a parameter of the produced electric signal and defining an expected minimum and/or maximum value of the parameter depending on the defined minimum and/or maximum value of the variable of the system. A determination is made, based on whether the detected value of the parameter is greater than the minimum value defined for the parameter and/or smaller than the maximum value, whether there is a malfunction of the electronic appliance provoked by an external electromagnetic interference field.