The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Feb. 20, 2014
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

Giorgio Massamiliano Membretti, Milan, IT;

Roberto Casiraghi, Milan, IT;

Igino Padovani, Novate Milanese, IT;

Assignee:

Hanking Electronics Ltd., Solon, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01P 15/125 (2006.01); G01C 21/00 (2006.01); B81C 1/00 (2006.01); G01P 21/00 (2006.01); G01P 15/08 (2006.01);
U.S. Cl.
CPC ...
G01P 15/125 (2013.01); B81C 1/00976 (2013.01); G01P 21/00 (2013.01); G01P 2015/0871 (2013.01); G01P 2015/0874 (2013.01);
Abstract

Various embodiments of the invention provide for stiction testing in MEMS devices, such as accelerometers. In certain embodiments, testing is accomplished by a high voltage smart circuit that enables an analog front-end circuit to accurately read the position of a movable proof-mass relative to a biased electrode in order to allow the detection of both contact and release conditions. Testing allows to detect actual or potential stiction failures and to reject defective parts in a Final Test stage of a manufacturing process where no other contributors to stiction issue can occur, thereby, minimizing stiction failure risks and extending the reliability of MEMS devices.


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