The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Mar. 04, 2011
Patrice Masson, Sherbrooke, CA;
Philippe Micheau, Sherbrooke, CA;
Nicolas Quaegebeur, Sherbrooke, CA;
Dominique Langlois Demers, Waterloo, CA;
Patrice Masson, Sherbrooke, CA;
Philippe Micheau, Sherbrooke, CA;
Nicolas Quaegebeur, Sherbrooke, CA;
Dominique Langlois Demers, Waterloo, CA;
Scopra Sciences et Génie s.e.c., Sherbrooke, Québec, unknown;
Abstract
The invention relates to a method for providing a structural condition of a structure, comprising providing an excitation wave generator; providing an excitation wave sensor; injecting an excitation burst wave into the structure using the excitation wave generator; obtaining a measured propagated excitation burst wave using the excitation wave sensor; correlating the measured propagated excitation burst wave with one of a plurality of theoretical dispersed versions of the excitation burst wave; and providing an indication of the structural condition of the structure corresponding to the correlated measured propagated excitation burst wave. The method may offer a better localization of the reflection points and thus of the potential defects present in a structure under inspection, when compared with a group velocity-based or time-of-flight (ToF) approach. The method may be particularly useful for structural health monitoring (SHM) and Non-Destructive Testing (NDT). The method may also enable determination of the mechanical properties of the structure.