The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Jul. 21, 2016
Applicant:
Okinawa Institute of Science and Technology School Corporation, Okinawa, JP;
Inventors:
Faisal Mahmood, Okinawa, JP;
Lars-Göran Wallentin Öfverstedt, Okinawa, JP;
Bo Ulf Skoglund, Okinawa, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/04 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 11/006 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/42 (2013.01); G01N 2223/612 (2013.01); G06T 2211/432 (2013.01);
Abstract
Apparatus for improving a three-dimensional (3D) reconstruction of a sample is programmed to execute instructions including: removing uncorrelated noise in said 3D reconstruction with COMET or other regularization techniques; and removing correlated noise in said 3D reconstruction by applying an Extended Field Iterative Reconstruction Technique (EFIRT) procedure.