The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Apr. 18, 2014
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Guenther Kostka, Erlangen, DE;
Peter Schmitt, Erlangen, DE;
Christian Huegel, Wendelstein, DE;
Ralf Goldstein, Erlangen, DE;
Abstract
A device for measuring a complexly formed object includes a plurality of light-section measuring devices, a rotator for causing a rotation between the complexly formed object and the plurality of light-section measuring devices around a rotation axis, wherein each of the plurality of light-section measuring devices is configured to generate a respective fan beam in a respective fan plane, wherein the fan planes are arranged such that the rotation axis extends within each of the fan planes, wherein the plurality of light-section measuring devices is configured such that the fan beams are directed to the complexly formed object from different fan directions which, when projected into a common plane through which the rotation axis extends, by rotation around the rotation axis, differ from each other.