The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Sep. 08, 2010
Applicants:

Fumio Ohtomo, Itabashi-ku, JP;

Kaoru Kumagai, Itabashi-ku, JP;

Hitoshi Otani, Itabashi-ku, JP;

Inventors:

Fumio Ohtomo, Itabashi-ku, JP;

Kaoru Kumagai, Itabashi-ku, JP;

Hitoshi Otani, Itabashi-ku, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/00 (2011.01); H04N 13/04 (2006.01); G01C 11/06 (2006.01); G03B 15/00 (2006.01); H04N 13/02 (2006.01);
U.S. Cl.
CPC ...
G01C 11/06 (2013.01); G03B 15/00 (2013.01); H04N 13/0239 (2013.01);
Abstract

The invention provides a wide-angle image pickup unit, comprising at least two cameras (and) to take digital images, wherein the two cameras are arranged in such a manner that optical axes (and) of the two cameras cross perpendicularly each other on a same plane and images of wide field angle α with the crossing point O as a center enable to be acquired, and wherein parts of field angles of the two cameras are superimposed on each other and an overlapping portion is formed by the two images superimposed on each other, and stereoscopic measurement can be performed based on the two images of the overlapping portion.


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