The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Oct. 09, 2012
Canon Kabushiki Kaisha, Tokyo, JP;
Nobuaki Kuwabara, Yokohama, JP;
Tetsuri Sonoda, Yokohama, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A three dimensional measurement apparatus comprising: a projection unit configured to project a pattern including a measurement pattern and a feature pattern onto an object; an image capturing unit configured to capture an image of the object onto which the pattern is projected; a grouping unit configured to divide the captured image into a plurality of regions using the measurement pattern in the pattern and a plurality of epipolar lines determined based on a positional relationship between the projection unit and the image capturing unit, thereby grouping predetermined regions among the plurality of divided regions; a feature recognition unit configured to recognize the feature pattern based on a difference in the feature pattern between the predetermined regions; and a three-dimensional shape calculation unit configured to calculate a three-dimensional shape of the object based on the feature pattern.