The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Jun. 04, 2014
Applicants:

Osaka University, Suita-shi, Osaka, JP;

Nippon Zenyaku Kogyo Co., Ltd., Sasagawa, Asaka-machi, JP;

Inventors:

Shizuo Akira, Osaka, JP;

Ken Ishii, Osaka, JP;

Cevayir Coban, Osaka, JP;

Yoshikatsu Igari, Fukushima, JP;

Yasumasa Kano, Fukushima, JP;

Akina Otsuki, Fukushima, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07D 487/22 (2006.01); C07F 15/02 (2006.01); A61K 39/39 (2006.01);
U.S. Cl.
CPC ...
C07F 15/025 (2013.01); A61K 39/39 (2013.01); C07D 487/22 (2013.01); C07B 2200/13 (2013.01);
Abstract

This invention provides a method of preparing a β-hematin crystal comprising a step of heating, the β-hematin crystal obtained by such method, and a vaccine adjuvant composition containing the β-hematin crystal. The β-hematin crystal has a needle-like morphology, it has an average particle size of 0.6 to 1.2 μm, and it exhibits main peaks characteristics for angles of diffraction (2θ) of 7.4°, 12.2°, 21.6°, and 24.1° in an X-ray diffraction pattern obtained by powder X-ray diffractometry with Cu—Kα rays (with each peak including a plus-minus 0.2° diffraction angle).


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