The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Mar. 31, 2015
Applicant:

Heidelberger Druckmaschinen, Heidelberg, DE;

Inventors:

Frank Schumann, Heidelberg, DE;

Frank Soltwedel, Sinsheim/Hoffenheim, DE;

Daniel Blatt, Roetgen-Rott, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41F 33/00 (2006.01); G06K 9/03 (2006.01); H04N 1/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
B41F 33/0036 (2013.01); G06K 9/036 (2013.01); G06T 7/001 (2013.01); H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00045 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30144 (2013.01); G06T 2207/30176 (2013.01);
Abstract

A method for testing the reliability of an error detection of an image inspection method by using a computer includes producing a defective test image by superposing specific error elements on an error-free reference image, carrying out the image inspection method with the defective test image, comparing the errors found by the image inspection method with the error set to be expected with the aid of the known errors added to the test image, and evaluating the reliability of the image inspection method with the aid of the difference between found and expected errors.


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