The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Jul. 14, 2016
Applicant:

Board of Regents, the University of Texas System, Austin, TX (US);

Inventors:

Carter B. White, Mesquite, TX (US);

Philippe Zimmern, Dallas, TX (US);

Robert C. Eberhart, Dallas, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); A61B 5/117 (2016.01); A61B 5/00 (2006.01); A61F 2/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/4337 (2013.01); A61B 5/0055 (2013.01); A61B 5/442 (2013.01); A61F 2/0063 (2013.01); A61B 5/0082 (2013.01); A61F 2250/0004 (2013.01);
Abstract

The present invention includes a device and method for measuring skin elasticity that comprises: a probe with one or more holes, a vacuum source, a pressure sensor, and one or more infrared or optical proximity sensors aligned about the one or more holes, wherein the probe further comprises a raised area surrounding the one or more holes; and a processor for recording the deformation of the skin using a control unit comprising a microcontroller connected to the one or more infrared or optical proximity sensors and the one or more pressure sensors, to measure an amount of skin drawn into and out of the one or more holes to determine the distance between the one or more proximity sensors and the skin both inside and outside the probe.


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