The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Jan. 08, 2014
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yoshiyuki Yamada, Tokyo, JP;

Makoto Fujinami, Tokyo, JP;

Yasuhiro Miyao, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/04 (2013.01); H04L 43/00 (2013.01); H04L 43/0894 (2013.01); H04L 43/10 (2013.01);
Abstract

An index calculation unit calculates a periodicity determination index for determining the presence of periodicity on the basis of the differential between each segment of the frequency distribution of input numerical data and a frequency distribution in accordance with a baseline distribution provided ahead of time. A determination unit uses the periodicity determination index calculated by the index calculation unit to determine the presence of periodicity including one or more periodic components present in the numerical data.


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