The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Aug. 02, 2012
Kimihiko Imamura, Osaka, JP;
Wataru Ouchi, Osaka, JP;
Yosuke Akimoto, Osaka, JP;
Toshizo Nogami, Osaka, JP;
Daiichiro Nakashima, Osaka, JP;
Kazuyuki Shimezawa, Osaka, JP;
Shoichi Suzuki, Osaka, JP;
Yasuyuki Kato, Osaka, JP;
Katsunari Uemura, Osaka, JP;
Kimihiko Imamura, Osaka, JP;
Wataru Ouchi, Osaka, JP;
Yosuke Akimoto, Osaka, JP;
Toshizo Nogami, Osaka, JP;
Daiichiro Nakashima, Osaka, JP;
Kazuyuki Shimezawa, Osaka, JP;
Shoichi Suzuki, Osaka, JP;
Yasuyuki Kato, Osaka, JP;
Katsunari Uemura, Osaka, JP;
SHARP KABUSHIKI KAISHA, Osaka, JP;
Abstract
A terminal is disclosed that includes a higher layer processing circuitry, a channel measurement circuitry, and a transmitting circuitry. The terminal is configured to set a first parameter and a second parameter measurement. The channel measurement circuitry is configured to perform a measurement of a reference signal received power based on a first reference signal in a case that the first parameter is configured in a measurement configuration, and perform a measurement of a reference signal received power based on a second reference signal in a case that at least the second parameter is configured in the measurement configuration. The transmitting circuitry is configured to report a first measurement report.