The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
May. 27, 2016
Avago Technologies General Ip (Singapore) Pte. Ltd., Singapore, SG;
Hans G. Rohdin, Los Altos, CA (US);
Bartholomeus H. Jansen, San Jose, CA (US);
John Stephen Kofol, Sunnyvale, CA (US);
Avago Technologies General IP (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A method is provided for calibrating a device under calibration (DUC) for optimizing performance of the DUC. The method includes receiving stimulus signal characteristics of a stimulus signal to be generated by the signal generator, including modulation type and duty cycle, where the stimulus signal characteristics are within a normal operating range of the DUC; receiving average output power set points and RF carrier frequencies of a DUC output signal; outputting the stimulus signal characteristics to a signal generator for generating the stimulus signal; iteratively performing an optimization process, using DUC calibration parameters that are simultaneously adjusted between consecutive iterations of the optimization process, to determine corresponding error functions based on measured power supply currents, output powers and linearities of the DUC output signal for the consecutive iterations, respectively, until a difference between consecutive error function values reaches a specified minimum; and using values of the calibration parameters corresponding to a last iteration.