The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Dec. 08, 2015
Applicant:
Flir Detection, Inc., Stillwater, OK (US);
Inventors:
Brent Knecht, Lebanon, IN (US);
Gary Gentry, Lafayette, IN (US);
Assignee:
FLIR Detection, Inc., Stillwater, OK (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0095 (2013.01); H01J 49/0031 (2013.01); H01J 49/022 (2013.01); H01J 49/04 (2013.01);
Abstract
Mass spectrometry instruments are provided that are configured to provide dynamic switching between positive and negative ion preparation and analysis during a single sample analysis. Mass spectrometry analysis methods are also provided that can include switching between positive and negative ion preparation and analysis during a single sample analysis.
Quick Actions:
Knecht, Brent. (2017). Mass analysis instruments and methods (U.S. Patent No. 9728386). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9728386
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile