The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Jul. 08, 2013
Palantir Technologies, Inc., Palo Alto, CA (US);
Brandon Burr, Palo Alto, CA (US);
Derek Cicerone, Palo Alto, CA (US);
Kevin Simler, Palo Alto, CA (US);
Palantir Technologies, Inc., Palo Alto, CA (US);
Abstract
A method that facilitates optimization analysis and sensitivity analysis of a data model comprises: receiving first data identifying a value function, parameters for the value function, and one or more specific parameter values for one or more of the parameters; storing a data model based on the value function and the specific parameter values; determining which parameters of the data model are capable of taking variable values; receiving second data identifying one or more selected parameters; receiving third data specifying a value selection approach for each of the selected parameters; determining a plurality of result values by substituting, based on the value selection approach, a plurality of input values for each of the selected parameters and evaluating the value function using the selected parameters and the substituted values; and generating and causing displaying a table of the result values.