The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Feb. 11, 2013
Applicant:
New York University, New York, NY (US);
Inventors:
Ashlesh Sharma, Redmond, WA (US);
Lakshminarayanan Subramanian, New York, NY (US);
Eric Brewer, Mill Valley, CA (US);
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 40/00 (2012.01); G06Q 40/02 (2012.01); G06K 9/00 (2006.01); G06Q 20/30 (2012.01); G07D 7/2033 (2016.01); G06Q 20/10 (2012.01);
U.S. Cl.
CPC ...
G06Q 40/02 (2013.01); G06K 9/00483 (2013.01); G06Q 20/30 (2013.01); G07D 7/2033 (2013.01); G06Q 20/108 (2013.01);
Abstract
Exemplary systems, methods and computer-accessible mediums can receive information comprising a first speckle pattern(s) associated with a portion(s) of the paper. The information can be generated by an optical arrangement, and the first speckle pattern(s) can be compared with a second speckle pattern(s) to determine if a similarity measure based on local or global descriptors is of equal to a predetermined amount or within a predetermined range.