The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Aug. 16, 2013
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Ching-Yung Lin, Forest Hills, NY (US);
Yale Song, Brighton, MA (US);
Zhen Wen, Springfield, NJ (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06N 99/00 (2010.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 5/022 (2013.01); G06N 99/005 (2013.01);
Abstract
A dataset including at least one temporal event sequence is collected. A one-class sequence classifier f(x) that obtains a decision boundary is statistically learned. At least one new temporal event sequence is evaluated, wherein the at least one new temporal event sequence is outside of the dataset. It is determined whether the at least one new temporal event sequence is one of a normal sequence or an abnormal sequence based on the evaluation. Numerous additional aspects are disclosed.