The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Sep. 24, 2013
Fujifilm Corporation, Tokyo, JP;
Hideki Yamagishi, Kanagawa, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
An image evaluation device includes: a reading unit that reads a sample image included in a sample printout recognized as a non-defective printout and that reads an inspection object image included in an inspection object printout obtained by printing an image corresponding to the sample image on a recording medium using a printing device based on image data representing the image; an extraction unit that extracts a line defect including a linear pattern formed in a specific direction from the inspection object image represented by inspection object image data, based on a difference value between sample image data obtained by reading the sample image and the inspection object image data; and an evaluation unit that evaluates a visibility of the line defect extracted by the extraction unit.