The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Jun. 18, 2014
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Anirudh Kondaveeti, Foster City, CA (US);

Derek Lin, San Mateo, CA (US);

Hulya Emir-Farinas, San Francisco, CA (US);

Assignee:

EMC IP Holding Co. LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/50 (2013.01); H04L 29/06 (2006.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/50 (2013.01); H04L 63/1425 (2013.01); G06F 21/552 (2013.01);
Abstract

Techniques to reduce false positives in detecting anomalous use of resources are disclosed. In various embodiments, resource access data indicating for each resource in a set of resources respective usage data for each of one or more users of the resource is received. Cluster analysis is performed to determine one or more clusters of users. For each cluster, a set of recommended resources to be associated with the cluster is determined. For each of at least a subset of users, a temporal behavior based model for each user that reflects one or more resources included in the set of recommended resources associated with a corresponding cluster of which the user is a member is generated.


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