The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Jan. 30, 2012
Qi Cheng, Toronto, CA;
John F. Hornibrook, Markham, CA;
Ting Y. Leung, San Jose, CA (US);
Xin Wu, San Jose, CA (US);
Daniel C. Zilio, Georgetown, CA;
Calisto P. Zuzarte, Pickering, CA;
Qi Cheng, Toronto, CA;
John F. Hornibrook, Markham, CA;
Ting Y. Leung, San Jose, CA (US);
Xin Wu, San Jose, CA (US);
Daniel C. Zilio, Georgetown, CA;
Calisto P. Zuzarte, Pickering, CA;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Techniques are disclosed for generating statistical views in a database system. In one embodiment, a request is received to execute a database workload. One or more constraints pertaining to executing the database workload is retrieved. The database workload is evaluated to generate multiple statistical view candidates. The statistical view candidates are refined based on the one or more constraints. One or more statistical views are then generated based on the refined statistical view candidates.