The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Jan. 31, 2014
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Yuriy Reznik, San Diego, CA (US);

Albert Scott Ludwin, San Diego, CA (US);

Hyukjune Chung, San Diego, CA (US);

Harinath Garudadri, San Diego, CA (US);

Naveen B. Srinivasamurthy, Bangalore, IN;

Phoom Sagetong, Orange, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/14 (2006.01); H04N 19/61 (2014.01); H04N 19/42 (2014.01);
U.S. Cl.
CPC ...
G06F 17/14 (2013.01); G06F 17/147 (2013.01); H04N 19/42 (2014.11); H04N 19/61 (2014.11);
Abstract

Techniques for efficiently performing full and scaled transforms on data received via full and scaled interfaces, respectively, are described and comprise (1) performing a first transform on a block of first input values to obtain a block of first output values by scaling the block to obtain scaled input values, performing a scaled one-dimensional (1D) transform on each row of the block, and performing a scaled 1D transform on each column of the block; and (2) performing a second transform on a block of second input values to obtain a block of second output values by performing a scaled 1D transform on each row of the block, performing a scaled 1D transform on each column of the block, and scaling the block.


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