The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Aug. 12, 2011
Applicants:

Sharad Agarwal, Seattle, WA (US);

Ratul Mahajan, Seattle, WA (US);

Alice X. Zheng, Seattle, WA (US);

Paramvir Bahl, Issaquah, WA (US);

Inventors:

Sharad Agarwal, Seattle, WA (US);

Ratul Mahajan, Seattle, WA (US);

Alice X. Zheng, Seattle, WA (US);

Paramvir Bahl, Issaquah, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/36 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3612 (2013.01); G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/2257 (2013.01); G06F 11/3604 (2013.01);
Abstract

An analysis management system (AMS) is described that analyzes the in-field behavior of a program resource installed on a collection of computing devices, such as mobile telephone devices or the like. In operation, the AMS can instruct different devices to collect data regarding different observation points associated with the program resource, thus spreading the reporting load among the devices. Based on the data that is collected, the AMS can update a dependency graph that describes dependencies among the observation points associated with the program resource. The AMS can then generate new directives based on the updated dependency graph. The AMS can also use the dependency graph and the collected data to infer information regarding observation points that is not directly supplied by the collected data.


Find Patent Forward Citations

Loading…