The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Apr. 15, 2014
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Kyeong Seok Lee, Seoul, KR;

Won Mok Kim, Seoul, KR;

Taek Sung Lee, Seoul, KR;

Wook Seong Lee, Seoul, KR;

Doo Seok Jeong, Wonju-si, KR;

Inho Kim, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G02B 5/00 (2006.01); G01N 21/552 (2014.01); B82Y 40/00 (2011.01); B82Y 15/00 (2011.01); G02B 5/02 (2006.01);
U.S. Cl.
CPC ...
G02B 5/008 (2013.01); B82Y 15/00 (2013.01); B82Y 40/00 (2013.01); G01N 21/554 (2013.01); G03F 7/2014 (2013.01); G03F 7/70375 (2013.01); G02B 5/0278 (2013.01);
Abstract

A method for fabricating a nanoantenna array may include forming a resist layer on a substrate, forming a focusing layer having a dielectric microstructure array on the resist layer, diffusing light one-dimensionally in a specific direction by using a linear diffuser, forming an anisotropic pattern on the resist layer by illuminating the light diffused by the linear diffuser on the focusing layer and the resist layer, depositing a material suitable for a plasmonic resonance onto the substrate and the resist layer on which the pattern is formed, and forming a nanoantenna array on the substrate by removing the resist layer and the material deposited on the resist layer. A light diffusing angle by the linear diffuser and a size of the dielectric microstructure are determined based on an aspect ratio of the pattern to be formed.


Find Patent Forward Citations

Loading…