The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Jul. 21, 2014
Z Terra Inc., Houston, TX (US);
Alexander M. Popovici, Katy, TX (US);
Ioan Sturzu, Houston, TX (US);
Tijmen J. Moser, The Hague, NL;
Iulian F. Musat, Katy, TX (US);
Nicolay Tanushev, Houston, TX (US);
Z TERRA INC., Houston, TX (US);
Abstract
In some embodiments, a time migration diffraction imaging method includes computing a pseudo-depth characterizing a subsurface seismic event by scaling a vertical traveltime using a scaling velocity. A specularity value for a subsurface seismic event is determined according to the pseudo-depth, and a contribution weight for a corresponding seismic trace amplitude is determined according to the specularity value. The specularity value may be determined according to an angle between a traveltime gradient and a normal to a local reflector surface. A diffraction image is generated according to a weighted sum of seismic trace amplitudes. The weighted sum attenuates the contribution of specular events relative to diffraction events.