The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Aug. 04, 2014
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

Maurice J. Halmos, Encino, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/58 (2006.01); G01S 7/48 (2006.01); G01S 17/50 (2006.01);
U.S. Cl.
CPC ...
G01S 17/58 (2013.01); G01S 7/4802 (2013.01); G01S 7/4808 (2013.01); G01S 17/50 (2013.01);
Abstract

Systems and corresponding methods for use in measuring rotation characteristics (e.g., rotation magnitude and direction) of remote targets are provided. A laser light of a known frequency is incident upon the target and reflected. A portion of the reflected laser light is directed to detector field of view, where it is measured and analyzed. The detector field of view is divided into multiple segments, each capable of independently measuring the intensity and frequency of laser light incident thereon. The rotation magnitude of the target may be correlated with the width of the total Doppler spread of reflected light incident upon the detector. The rotation direction of the target may be correlated to a difference in the Doppler spreads measured for corresponding halves of the detector.


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