The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Dec. 29, 2014
Avery Dennison Retail Information Services, Llc, Mentor, OH (US);
Adrian N. Farr, Essex, GB;
Ian James Forster, Essex, GB;
AVERY DENNISON RETAIL INFORMATION SERVICES, LLC, Westborough, MA (US);
Abstract
Systems and methods are provided for testing remote frequency identification (RFID) straps. A testing system includes an amplifier electrically coupled to an inductor or inductive component. The system further includes a pair of contact points to be placed in contact with a pair of contact pads of an RFID strap. Connecting the contact points and the contact pads places the RFID strap in parallel with the inductor to define a resonant circuit. The characteristics of the resonant circuit as an oscillator depend at least in part on the capacitance and the resistance of the RFID strap. As such, the characteristics of the resonant circuit as an oscillator may be monitored to determine the capacitance and/or the resistance of the RFID strap. One or more characteristics of the RFID strap may be compared to one or more threshold values to determine whether the RFID strap is acceptable or defective.