The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Aug. 03, 2012
Applicants:

John Neeley, Seattle, WA (US);

Jordan Schlichting, New Hope, MN (US);

Thomas Mcmanus, Plymouth, MN (US);

Peter Bergstrom, Saint Paul, MN (US);

Lindsey Berdan, Seattle, WA (US);

Joseph V. Ferrante, Redmond, WA (US);

Michael Devin Stuart, Issaquah, WA (US);

Inventors:

John Neeley, Seattle, WA (US);

Jordan Schlichting, New Hope, MN (US);

Thomas McManus, Plymouth, MN (US);

Peter Bergstrom, Saint Paul, MN (US);

Lindsey Berdan, Seattle, WA (US);

Joseph V. Ferrante, Redmond, WA (US);

Michael Devin Stuart, Issaquah, WA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G06F 11/2294 (2013.01);
Abstract

Systems and techniques for obtaining and maintaining maintenance records for various assets are described. In one embodiment, a computing device may be wirelessly coupled to a measurement device when the computing device is placed in proximity with the computing device. Upon measuring one or more parameters of a device under test (DUT), the measurement device may provide the measured parameters to the computing device in the form of measurement data. In some embodiments, the computing device associates the measured parameters with the corresponding DUT from which the measurements were obtained and provides the associated measured parameter to, for example, a service provider for future access. In another embodiment, the measurement device itself is configured to associate the measurement parameters with the DUT and provide the associated measurement parameters to the service provider.


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