The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Sep. 24, 2010
Applicants:
Frank Klein, Berlin, DE;
Thomas Weigel, Michendorf, DE;
Karl Kratz, Berlin, DE;
Friedrich Jung, Dresden, DE;
Bernhard Hiebl, Berlin, DE;
Andreas Lendlein, Berlin, DE;
Karola Lützow, Berlin, DE;
Andreas Kurtz, Berlin, DE;
Petra Reinke, Berlin, DE;
Andy R•mhild, Berlin, DE;
Inventors:
Frank Klein, Berlin, DE;
Thomas Weigel, Michendorf, DE;
Karl Kratz, Berlin, DE;
Friedrich Jung, Dresden, DE;
Bernhard Hiebl, Berlin, DE;
Andreas Lendlein, Berlin, DE;
Karola Lützow, Berlin, DE;
Andreas Kurtz, Berlin, DE;
Petra Reinke, Berlin, DE;
Andy R•mhild, Berlin, DE;
Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C40B 30/06 (2006.01); C40B 40/00 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5008 (2013.01);
Abstract
The present invention relates to a method for testing different selected materials and/or surface structures for the culture of cells and/or microorganisms.