The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Feb. 03, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Sung Chan Park, Suwon-si, KR;
Joo Young Kang, Yongin-si, KR;
Kyu Hong Kim, Seoul, KR;
Jung Ho Kim, Yongin-si, KR;
Su Hyun Park, Hwaseong-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/52 (2006.01); G01S 15/89 (2006.01); G01N 29/06 (2006.01);
U.S. Cl.
CPC ...
G01N 29/0663 (2013.01); G01N 29/069 (2013.01); G01S 7/52049 (2013.01); G01S 15/8997 (2013.01); G01N 2291/106 (2013.01);
Abstract
An ultrasound based measurement method includes obtaining an element of synthetic data corresponding to a focusing point in a region adjacent to a reflector by applying a synthetic focusing method to received data corresponding to an actual focusing point; and generating an image of the reflector based on the element of the synthetic data.