The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Sep. 05, 2014
Applicants:
Tommy Bourgelas, Shannon, CA;
Martin St-laurent, Quebec, CA;
Guillaume Painchaud-april, Quebec, CA;
Inventors:
Assignee:
OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC., Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 15/06 (2006.01); G01S 7/56 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01); G01N 29/04 (2006.01); G01N 29/06 (2006.01); G01N 29/07 (2006.01);
U.S. Cl.
CPC ...
G01N 29/043 (2013.01); G01N 29/0645 (2013.01); G01N 29/07 (2013.01); G01N 2291/011 (2013.01); G01N 2291/101 (2013.01); G01N 2291/106 (2013.01); G01N 2291/2636 (2013.01);
Abstract
Disclosed is an ultrasonic IRIS inspection system and a method of providing automatically compensated concentric B-scans by means of curve-fitting the unadjusted tube boundaries from inspection data, and from the curve fitted theoretical circle, using non-linear regression analysis to determine an adjusted center. The off-center distance between the adjust center and the misaligned center is then used to produce concentric inspection result by compensating the unadjusted inspection result with the off-center distance.