The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2017
Filed:
Oct. 30, 2014
Applicant:
Tohoku University, Sendai-shi, Miyagi, JP;
Inventor:
Atsushi Momose, Sendai, JP;
Assignee:
Tohoku University, Sendai-shi, Miyagi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01); G01N 23/20 (2006.01); A61B 6/00 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20075 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/484 (2013.01); G21K 1/06 (2013.01); G21K 2207/005 (2013.01);
Abstract
An accurate non-destructive inspection of a moving subject is conducted using a radiation source unit that irradiates radioactive rays toward gratings. Each grating includes a plurality of grating members. A radioactive ray detector unit detects the radioactive rays diffracted by the plurality of grating members. The plurality of grating members are arranged with a predetermined phase difference such that moiré pattern images respectively formed by the radioactive rays transmitted through first to third partial areas have a phase difference between the moiré pattern images.