The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

May. 12, 2017
Applicant:

Airware, Inc., Goleta, CA (US);

Inventors:

Jacob Y Wong, Goleta, CA (US);

Thomas Campbell, Newbury Park, CA (US);

Assignee:

AIRWARE, INC., Goleta, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01);
Abstract

NDIR is used to determine a concentration of a chosen molecule M in a liquid sample which contains one or more interfering molecules Mwhich absorb radiation at the signal wavelength used in the NDIR process by addition of an interference source. M is calculated by electronics which use R(t) from a pulsed signal and reference channel output and a calibration curve which is validated by use of R(t) from a pulsed interference and reference channel output. Signal, interference and reference sources are pulsed at a frequency which is sufficiently fast so that a given molecule of M or Mwill not pass in and out of the liquid sampling matrix within the pulsing frequency.


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