The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Nov. 20, 2013
Applicant:

Bertin Technologies, Montigny le Bretonneux, FR;

Inventors:

Franck Fervel, Peynier, FR;

Philippe Bernascolle, Tourves, FR;

Assignee:

BERTIN TECHNOLOGIES, Montigny le Bretonneux, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01N 33/00 (2006.01); G01N 21/47 (2006.01); G01J 3/42 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01J 3/42 (2013.01); G01N 21/47 (2013.01); G01N 33/0031 (2013.01); G01N 33/0036 (2013.01); G02B 26/0833 (2013.01);
Abstract

A detector device for optically detecting a gas in a zone of space under observation, the device comprising a camera and means for continuously detecting at least one gas in the observed zone by analyzing absorbance in a plurality of different spectral bands. The device further comprises a matrix of micromirrors that are individually steerable between at least two positions, in a first of which they reflect the radiant flux coming from the observed zone to the camera for detecting gas in said spectral bands, and in a second of which they reflect the radiant flux coming from the observed zone to a Fourier transform infrared spectroscope.


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