The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Dec. 17, 2013
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Ecole Centrale DE Lyon, Ecully, FR;

Institut National Des Sciences Appliquees DE Lyon, Villeurbanne, FR;

Universite Claude Bernard Lyon I, Villeurbanne, FR;

Universite T. Chevtchenko DE Kiev, Kiev, UA;

Inventors:

Sergeii Lytvynenko, Kiev, UA;

Dmytro Beilobrov, Kiev, UA;

Volodymyr Lysenko, Villeurbanne, FR;

Valeriy Skryshevskyy, Kiev, UA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/31 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/27 (2013.01); G01N 21/1717 (2013.01); G01N 21/31 (2013.01); G01N 2021/1719 (2013.01); G01N 2201/061 (2013.01);
Abstract

A device for characterizing a fluid medium with the help of a photoelectric transducer comprises at least one semiconductor substrate possessing at least one space charge zone and presenting a reception surface for receiving the fluid medium in order to constitute an interface between the substrate and the fluid medium, a production system for producing a spot light beam that is amplitude-modulated and that lights at least one zone of the interface through the fluid medium, a measurement system for measuring values of a photoelectric magnitude delivered while performing the lighting so as to create a matrix of values of the photoelectric magnitude, and a processor system for processing values of the photoelectric magnitude delivered by the measurement system and adapted to use the matrix to determine an electronic signature characteristic of the fluid medium.


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