The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Dec. 26, 2013
Applicant:

Medi-physics, Inc., Princeton, NJ (US);

Inventors:

Kevin M Helle, Bartlett, IL (US);

Michael T Schneider, Crystal Lake, IL (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); B01D 65/10 (2006.01); A61L 2/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/082 (2013.01); A61L 2/022 (2013.01); B01D 65/102 (2013.01); G01N 2015/084 (2013.01);
Abstract

A dual-filter dual-integrity test conduit assembly allows for in-situ testing of both filters with separate, duplicate systems for membrane integrity so that if the first tester filter fails, the second filter may be tested with a different, but identical method with its own gauges and nitrogen supply so as to further isolate malfunctions of the filter integrity test equipment as a cause for erroneous batch failures.


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